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Design and Fabrication of Diffractive Optical Elements with MATLAB / Anand Vijayakumar (2017, cop. 2017)
Titre : Design and Fabrication of Diffractive Optical Elements with MATLAB Type de document : texte imprimé Auteurs : Anand Vijayakumar, Auteur ; Shanti Bhattacharya, Auteur ; Society of Photo-Optical Instrumentation Engineers (SPIE), Auteur Editeur : Bellingham, Wash. : SPIE Press Année de publication : 2017, cop. 2017 Collection : SPIE tutorial texts num. TT 109 Importance : 1 vol. (xv-276 p.) Présentation : ill. en n. et bl. Format : 25 cm Accompagnement : 1 CD ROM ISBN/ISSN/EAN : 978-1-5106-0705-7 Note générale : PPN 203069005 Langues : Anglais (eng) Tags : MATLAB Diffraction -- Mathematics Optics -- Mathematics MATLAB (logiciel) Diffraction -- Mathématiques Optique -- Mathématiques Index. décimale : 510.285 53 Mathématiques - Informatique appliquée - Programmes Note de contenu : Design of diffractive optical elements -- Design and analysis of advanced diffractive optical elements -- Analysis of DOEs in the Fresnel diffraction regimes -- Substrate aberration correction techniques and error analysis -- Multifunctional diffractive optical elements -- Computer-generated holographic optical elements -- Fabrication of DOEs. Design and Fabrication of Diffractive Optical Elements with MATLAB [texte imprimé] / Anand Vijayakumar, Auteur ; Shanti Bhattacharya, Auteur ; Society of Photo-Optical Instrumentation Engineers (SPIE), Auteur . - Bellingham, Wash. : SPIE Press, 2017, cop. 2017 . - 1 vol. (xv-276 p.) : ill. en n. et bl. ; 25 cm + 1 CD ROM. - (SPIE tutorial texts; TT 109) .
ISBN : 978-1-5106-0705-7
PPN 203069005
Langues : Anglais (eng)
Tags : MATLAB Diffraction -- Mathematics Optics -- Mathematics MATLAB (logiciel) Diffraction -- Mathématiques Optique -- Mathématiques Index. décimale : 510.285 53 Mathématiques - Informatique appliquée - Programmes Note de contenu : Design of diffractive optical elements -- Design and analysis of advanced diffractive optical elements -- Analysis of DOEs in the Fresnel diffraction regimes -- Substrate aberration correction techniques and error analysis -- Multifunctional diffractive optical elements -- Computer-generated holographic optical elements -- Fabrication of DOEs. Réservation
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Code-barres Cote Support Localisation Section Disponibilité Nom du donateur OCA-VV-002069 E5-2069 Ouvrages / Books OCA Bib. Lagrange Nice Valrose VV-E5-Informatique Disponible Laser Beam Propagation through Random Media [2nd ed.] / Larry C. Andrews (2005)
Titre : Laser Beam Propagation through Random Media [2nd ed.] Type de document : texte imprimé Auteurs : Larry C. Andrews, Auteur ; Ronald L. Phillips, Auteur Mention d'édition : Second edition Editeur : Bellingham, Wash. : SPIE Press Année de publication : 2005 Importance : xxiii, 782 p. Présentation : ill Format : 27 cm ISBN/ISSN/EAN : 978-0-8194-5948-0 Note générale : ISBN : 0-8194-5948-8 . - PPN 094619492 Langues : Anglais (eng) Tags : Faisceaux laser Faisceaux laser -- Effets de l'atmosphère Turbulence atmosphérique Ondes -- Propagation Laser beams Laser beams -- Atmospheric effects Atmospheric turbulence Index. décimale : 621.366 Lasers Note de contenu : Includes bibliographical references and index Laser Beam Propagation through Random Media [2nd ed.] [texte imprimé] / Larry C. Andrews, Auteur ; Ronald L. Phillips, Auteur . - Second edition . - Bellingham, Wash. : SPIE Press, 2005 . - xxiii, 782 p. : ill ; 27 cm.
ISBN : 978-0-8194-5948-0
ISBN : 0-8194-5948-8 . - PPN 094619492
Langues : Anglais (eng)
Tags : Faisceaux laser Faisceaux laser -- Effets de l'atmosphère Turbulence atmosphérique Ondes -- Propagation Laser beams Laser beams -- Atmospheric effects Atmospheric turbulence Index. décimale : 621.366 Lasers Note de contenu : Includes bibliographical references and index Réservation
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Code-barres Cote Support Localisation Section Disponibilité Nom du donateur OCA-VV-001833 B5-1833 Ouvrages / Books OCA Bib. Lagrange Nice Valrose VV-B5-Turbulence atmosphérique Sorti jusqu'au 31/07/2022 LiDAR technologies and systems / Paul F. McManamon (2019, cop. 2019)
Titre : LiDAR technologies and systems Type de document : texte imprimé Auteurs : Paul F. McManamon (1946-....), Auteur Editeur : Bellingham, Wash. : SPIE Press Année de publication : 2019, cop. 2019 Importance : 1 vol. (xiv-504 p.) Présentation : ill. en noir et en coul. Format : 26 cm ISBN/ISSN/EAN : 978-1-5106-2539-6 Note générale : PPN 253845505 Langues : Anglais (eng) Tags : Lidar Télécommunications optiques Radar Optical radar Optical communications Index. décimale : 621.367 8 Technologie de la télédétection Résumé : LiDAR is one of many active sensor technologies that uses electromagnetic radiation. Operating in the optical and infrared wavelengths, it is similar to more-familiar passive EO/IR sensor technology. It is also similar to radar in that it uses reflected electromagnetic radiation emitted by the sensor. LiDAR is commonly used for making high-resolution maps and has applications in geodesy, geomatics, archaeology, geography, geology, geomorphology, seismology, forestry, atmospheric physics, laser guidance, airborne laser swath mapping, and laser altimetry. It is also being used for control and navigation of some autonomous cars.
The first part of LiDAR Technologies and Systems introduces LiDAR and its history, and then covers the LiDAR range equation and the link budget (how much signal a LiDAR must emit in order to get a certain number of reflected photons back), as well as the rich phenomenology of LiDAR, which results in a diverse array of LiDAR types. The middle chapters discuss the components of a LiDAR system, including laser sources and modulators, LiDAR receivers, beam-steering approaches, and LiDAR processing. The last part covers testing, performance metrics, and significant applications, including how to build systems for some of the more popular applications.
(4ème de couverture)Note de contenu : Références bibliographiques en fin de chapitre. Index sujet p. 499-504 LiDAR technologies and systems [texte imprimé] / Paul F. McManamon (1946-....), Auteur . - Bellingham, Wash. : SPIE Press, 2019, cop. 2019 . - 1 vol. (xiv-504 p.) : ill. en noir et en coul. ; 26 cm.
ISBN : 978-1-5106-2539-6
PPN 253845505
Langues : Anglais (eng)
Tags : Lidar Télécommunications optiques Radar Optical radar Optical communications Index. décimale : 621.367 8 Technologie de la télédétection Résumé : LiDAR is one of many active sensor technologies that uses electromagnetic radiation. Operating in the optical and infrared wavelengths, it is similar to more-familiar passive EO/IR sensor technology. It is also similar to radar in that it uses reflected electromagnetic radiation emitted by the sensor. LiDAR is commonly used for making high-resolution maps and has applications in geodesy, geomatics, archaeology, geography, geology, geomorphology, seismology, forestry, atmospheric physics, laser guidance, airborne laser swath mapping, and laser altimetry. It is also being used for control and navigation of some autonomous cars.
The first part of LiDAR Technologies and Systems introduces LiDAR and its history, and then covers the LiDAR range equation and the link budget (how much signal a LiDAR must emit in order to get a certain number of reflected photons back), as well as the rich phenomenology of LiDAR, which results in a diverse array of LiDAR types. The middle chapters discuss the components of a LiDAR system, including laser sources and modulators, LiDAR receivers, beam-steering approaches, and LiDAR processing. The last part covers testing, performance metrics, and significant applications, including how to build systems for some of the more popular applications.
(4ème de couverture)Note de contenu : Références bibliographiques en fin de chapitre. Index sujet p. 499-504 Réservation
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Code-barres Cote Support Localisation Section Disponibilité Nom du donateur OCA-NI-010473 010473 Ouvrages / Books OCA Bib. Nice Mont-Gros NI-Sous sol-1-Ouvrages Sorti jusqu'au 12/07/2023 Optical scattering [3rd ed.] / John C. Stover (cop. 2012)
Titre : Optical scattering [3rd ed.] : measurement and analysis Type de document : texte imprimé Auteurs : John C. Stover, Auteur Mention d'édition : Third edition Editeur : Bellingham, Wash. : SPIE Press Année de publication : cop. 2012 Importance : 1 vol. (XXIV-307 p.) Présentation : ill, couv ill. en coul. Format : 26 cm ISBN/ISSN/EAN : 978-1-62841-840-8 Note générale : Soft cover printing 2015.- PPN 237370344 Langues : Anglais (eng) Tags : Lumière -- Diffusion Light -- Scattering Index. décimale : 535.43 Diffusion Résumé : The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light. (SPIE press) Note de contenu : Sommaire (abrégé) : Preface to the 1st ed. (xiii) - Preface to the 2nd ed. (xv) - Preface to the 3rd ed. (xix) - List of Acronyms (xxiii) - Chap. 1 Quantifying light scatter (p.1) - Chap. 2 Quantifying surface roughness (p.23) - Chap.3 Scatter calculations and diffraction theory (p.47)- Chap. 4 Using Rayleigh-Rice to calculate Smooth-Surface statistics from the BRDF (p.69) - Chap. 5 Polarization of scattered light (p.91) - Chap.6 Scattering models for discrete surface features (p.109) - Chap. 7 Instrumentation and measurement issues (p.115) - Chap. 8 Predicting scatter from roughness (p.157) - Chap. 9 Detection of discrete defects (p.185) - Chap. 10 Appearance and scattered light (p.201) - Chap.11 Industrial applications (p.209) - Chap.12 Published scatter standards (p.229) - Chap.13 Scatter specifications (p.239) - Appendix A. Review of electromagnetic wave propagation (p.257) - Appendix B. Kirchhoff diffraction from sinusoidal gratings (p.265) - Appendix C. BSDF data (p.273)- Appendix D. Units (p.281) - References (p.283) - Works consulted (p.297) - Index (p.303) Optical scattering [3rd ed.] : measurement and analysis [texte imprimé] / John C. Stover, Auteur . - Third edition . - Bellingham, Wash. : SPIE Press, cop. 2012 . - 1 vol. (XXIV-307 p.) : ill, couv ill. en coul. ; 26 cm.
ISBN : 978-1-62841-840-8
Soft cover printing 2015.- PPN 237370344
Langues : Anglais (eng)
Tags : Lumière -- Diffusion Light -- Scattering Index. décimale : 535.43 Diffusion Résumé : The first edition of this book concentrated on relating scatter from optically smooth surfaces to the microroughness on those surfaces. After spending six years in the semiconductor industry, Dr. Stover has updated and expanded the third edition. Newly included are scatter models for pits and particles as well as the use of wafer scanners to locate and size isolated surface features. New sections cover the multimillion-dollar wafer scanner business, establishing that microroughness is the noise, not the signal, in these systems. Scatter measurements, now routinely used to determine whether small-surface features are pits or particles and inspiring new technology that provides information on particle material, are also discussed. These new capabilities are now supported by a series of international standards, and a new chapter reviews those documents. New information on scatter from optically rough surfaces has also been added. Once the critical limit is exceeded, scatter cannot be used to determine surface-roughness statistics, but considerable information can still be obtained - especially when measurements are made on mass-produced products. Changes in measurement are covered, and the reader will find examples of scatter measurements made using a camera for a fraction of the cost and in a fraction of the time previously possible. The idea of relating scatter to surface appearance is also discussed, and appearance has its own short chapter. After all, beauty is in the eye of the beholder, and what we see is scattered light. (SPIE press) Note de contenu : Sommaire (abrégé) : Preface to the 1st ed. (xiii) - Preface to the 2nd ed. (xv) - Preface to the 3rd ed. (xix) - List of Acronyms (xxiii) - Chap. 1 Quantifying light scatter (p.1) - Chap. 2 Quantifying surface roughness (p.23) - Chap.3 Scatter calculations and diffraction theory (p.47)- Chap. 4 Using Rayleigh-Rice to calculate Smooth-Surface statistics from the BRDF (p.69) - Chap. 5 Polarization of scattered light (p.91) - Chap.6 Scattering models for discrete surface features (p.109) - Chap. 7 Instrumentation and measurement issues (p.115) - Chap. 8 Predicting scatter from roughness (p.157) - Chap. 9 Detection of discrete defects (p.185) - Chap. 10 Appearance and scattered light (p.201) - Chap.11 Industrial applications (p.209) - Chap.12 Published scatter standards (p.229) - Chap.13 Scatter specifications (p.239) - Appendix A. Review of electromagnetic wave propagation (p.257) - Appendix B. Kirchhoff diffraction from sinusoidal gratings (p.265) - Appendix C. BSDF data (p.273)- Appendix D. Units (p.281) - References (p.283) - Works consulted (p.297) - Index (p.303) Réservation
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Code-barres Cote Support Localisation Section Disponibilité Nom du donateur OCA-NI-009824 009824 Ouvrages / Books OCA Bib. Nice Mont-Gros NI-Salle de lecture-Ouvrages Disponible Photonics Rules of Thumb [3rd ed.] / John Lester Miller (2020)
Titre : Photonics Rules of Thumb [3rd ed.] Type de document : texte imprimé Auteurs : John Lester Miller, Auteur ; Edward J. Friedman, Auteur ; John N. Sanders-Reed, Auteur Mention d'édition : Third edition Editeur : Bellingham, Wash. : SPIE Press Année de publication : 2020 Importance : 1 vol. (xxi-714 p.-[3 p.,715-717]) Présentation : ill., couv. ill en coul. Format : 25 cm ISBN/ISSN/EAN : 978-1-5106-3175-5 Note générale : Previous ed.: 1996 (1st ed.) ; 2003 (2nd ed.).- PPN 249757516 Langues : Anglais (eng) Tags : Photonique Optoélectronique Électrooptique Lasers Océanographie -- Optique Astronomie -- Optique Radiométrie optique Photogrammétrie Optique -- Instruments Diffraction Optique adaptative Turbulence atmosphérique Résolution (optique) Optique physiologique Vision Oeil -- Accommodation Photonics Optoelectronics Electrooptics Oceanography -- Optics Astronomy -- Optics Optical radiometry Photogrammetry Optical instruments Optics, Adaptive Atmospheric turbulence Resolution (Optics) Physiological optics Eye -- Physiology Eye -- Accommodation and refraction Index. décimale : 621.381 045 Optoélectronique Note de contenu : Sommaire (abrégé) : Preface Acknowledgements - 1 Astronomy -- 2 Atmospherics -- 3 Acquisition, Tracking, and Pointing -- 4 Backgrounds -- 5 Cost and Economics -- 6 Degraded Visual Environments -- 7 Focal Plane Arrays -- 8 Human Vision -- 9 LASERS : Introduction - Lidar Basic Equations - Laser Brightness - Laser Beam Quality - Gaussian Beam Radius - On-Axis Intensity of a Beam - Aperture Size for Laser Beams - Laser Beam Divergence - Laser Beam Spread vs. Diffraction - Types of Lidars - Laser Radar Range Equation - Lidar Bidirectional Reflectance Distribution Function - Thermal Focusing in Laser Rods - Cross-Section of a Retroreflector - Air Breakdown -- 10 Materials and Structures -- 11 Miscellaneous -- 12 Ocean Optics -- 13 Optical Design and Analysis -- 14 Optical Manufacture and Test -- 15 Photogrammetry -- 16 Radiometry -- 17 Systems -- 18 Target Phenomenology -- Appendix -- Glossary (p. 639) -- Index (p. 707-714) - Author biographies (p.715) Photonics Rules of Thumb [3rd ed.] [texte imprimé] / John Lester Miller, Auteur ; Edward J. Friedman, Auteur ; John N. Sanders-Reed, Auteur . - Third edition . - Bellingham, Wash. : SPIE Press, 2020 . - 1 vol. (xxi-714 p.-[3 p.,715-717]) : ill., couv. ill en coul. ; 25 cm.
ISBN : 978-1-5106-3175-5
Previous ed.: 1996 (1st ed.) ; 2003 (2nd ed.).- PPN 249757516
Langues : Anglais (eng)
Tags : Photonique Optoélectronique Électrooptique Lasers Océanographie -- Optique Astronomie -- Optique Radiométrie optique Photogrammétrie Optique -- Instruments Diffraction Optique adaptative Turbulence atmosphérique Résolution (optique) Optique physiologique Vision Oeil -- Accommodation Photonics Optoelectronics Electrooptics Oceanography -- Optics Astronomy -- Optics Optical radiometry Photogrammetry Optical instruments Optics, Adaptive Atmospheric turbulence Resolution (Optics) Physiological optics Eye -- Physiology Eye -- Accommodation and refraction Index. décimale : 621.381 045 Optoélectronique Note de contenu : Sommaire (abrégé) : Preface Acknowledgements - 1 Astronomy -- 2 Atmospherics -- 3 Acquisition, Tracking, and Pointing -- 4 Backgrounds -- 5 Cost and Economics -- 6 Degraded Visual Environments -- 7 Focal Plane Arrays -- 8 Human Vision -- 9 LASERS : Introduction - Lidar Basic Equations - Laser Brightness - Laser Beam Quality - Gaussian Beam Radius - On-Axis Intensity of a Beam - Aperture Size for Laser Beams - Laser Beam Divergence - Laser Beam Spread vs. Diffraction - Types of Lidars - Laser Radar Range Equation - Lidar Bidirectional Reflectance Distribution Function - Thermal Focusing in Laser Rods - Cross-Section of a Retroreflector - Air Breakdown -- 10 Materials and Structures -- 11 Miscellaneous -- 12 Ocean Optics -- 13 Optical Design and Analysis -- 14 Optical Manufacture and Test -- 15 Photogrammetry -- 16 Radiometry -- 17 Systems -- 18 Target Phenomenology -- Appendix -- Glossary (p. 639) -- Index (p. 707-714) - Author biographies (p.715) Réservation
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Code-barres Cote Support Localisation Section Disponibilité Nom du donateur OCA-NI-009917 009917 Ouvrages / Books OCA Bib. Nice Mont-Gros NI-Salle de lecture-Ouvrages Disponible Speckle phenomena in optics / Joseph W. Goodman (2020)
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